Diffraction and Interference
نویسندگان
چکیده
We measure the patterns produced by a CW laser near 650 nm passing through one and two slit apertures with a detector mounted on a linear translator. Data collected for a single slit of width a = .04 mm is used to measure the wavelength of light. Data collected for a double slit aperture of slit separation d ~ .25 mm and width a ~ .04 mm is fit with an algorithm that varies the parameters a and d in order to obtain a model that best describes the pattern. We report a wavelength of 716.15 ± 10.06 nm from the single slit data and parameters a = .035 mm and d = .258 mm from the double slit data.
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